Ion Microscopes, FIB and Dual Beam Systems

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Destrezas que aprenderás

Layout of the transmission electron microscope and its main working modes., Main components of electron and ion microscopes, Energy dispersive and wavelength dispersive X-ray spectrometers, Scanning electron microscope layout and electron optics., Sputtering with focused ion beam and its applications.

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    Петров Юрий Владимирович

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