SIMS: Basic Principles and Components

Loading...
Del curso dictado por National Research Nuclear University MEPhI
Methods of Surface Analysis
5 calificaciones
National Research Nuclear University MEPhI
5 calificaciones
De la lección
Particle Diagnostics. Secondary Ion Mass Spectrometry (SIMS)
This module deals with methods which utilize heavy particles (protons and other ions) as primary bombarding particles. In SIMS sputtering yield is being analyzed, giving great information on surface composition.

Conoce a los instructores

  • Sadovsky Yaroslav
    Sadovsky Yaroslav
    Assistant
    Department of Plasma Physics

Explora nuestro catálogo

Inscríbete de manera gratuita y obtén recomendaciones personalizadas, actualizaciones y ofertas.