SIMS: Basic Principles and Components

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4.8 (119 calificaciones)
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KR
7 de abr. de 2020

I am currently doing research on thin film. This course is going to help me a lot. Thanks a lot to the Professor. He is amazing.

AS
18 de may. de 2020

It was very informative and I am happy to competed this wonderful course. Very point to point effort done by Coursera and MEPhI.

De la lección
Particle Diagnostics. Secondary Ion Mass Spectrometry (SIMS)
This module deals with methods which utilize heavy particles (protons and other ions) as primary bombarding particles. In SIMS sputtering yield is being analyzed, giving great information on surface composition.

Impartido por:

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    Sadovsky Yaroslav

    Assistant

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