SIMS: Basic Principles and Components

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KR

Apr 08, 2020

I am currently doing research on thin film. This course is going to help me a lot. Thanks a lot to the Professor. He is amazing.

SS

May 04, 2020

Very good course. From week 1 to week 5 all the contents and explanation about the are very well.

De la lección
Particle Diagnostics. Secondary Ion Mass Spectrometry (SIMS)
This module deals with methods which utilize heavy particles (protons and other ions) as primary bombarding particles. In SIMS sputtering yield is being analyzed, giving great information on surface composition.

Impartido por:

  • Sadovsky Yaroslav

    Sadovsky Yaroslav

    Assistant

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